The ESA1 is a system of EMC tools for measuring the interference of assemblies and devices. The CS-ESA software allows the developer to quickly and comprehensively suppress interference affecting the DUT. Interference measurements taken during the development stage with ESA1 are proportional to the results from far-field measurements or from measurements with artificial networks. With the ESA1 tools disturbance sources can be localized, effects can be detected, and EMC measures individually determined. The effects of improvements implemented by ESA1 are proportional to the results from far-field measurements. ESA1 is designed for use at the developer’s working place.

Scope of delivery

• 1xCS-ESA set, ChipScan-ESA Software / USB
• 1xDongle, Licence Dongle
• 1xHFW 21, RF Current Transformer
• 1xHFA 21, RF Bypass
• 1xZ23-1 set, Shielding Tent (900 x 500x 400) mm
• 1xPA 203 BNC, Preamplifier 100 kHz up to 3 GHz
• 1xRF-B 0.3-3, H-Field Probe mini 30 MHz up to 3 GHz
• 1xRF-B 3-2, H-Field Probe 30 MHz up to 3 GHz
• 1xRF-E 02, E-Field Probe 30 MHz up to 1.5 GHz
• 1xRF-E 05, E-Field Probe 30 MHz up to 3 GHz
• 1xRF-E 10, E-Field Probe 30 MHz up to 3 GHz
• 1xRF-R 0.3-3, H-Field Probe mini 30 MHz up to 3 GHz
• 1xRF-R 3-2, H-Field Probe 30 MHz up to 3 GHz
• 1xRF-R 50-1, H-Field Probe 30 MHz up to 3 GHz
• 1xRF-R 400-1, H-Field Probe 30 MHz up to 3 GHz
• 1xRF-U 2.5-2, H-Field Probe 30 MHz up to 3 GHz
• 1xRF-U 5-2, H-Field Probe 30 MHz up to 3 GHz
• 1xESA1 acc, Accessories
• 1x ESA1 case, System case
• 1x ESA1 m, User Manual

Technical parameters

HFW 21 RF Current Transformer

Frequency range 100 kHz - 1 GHz

Continuous power rating

Current 10 A

Dielectric strength 50 V

Sizes (L x W x H) (135 x 32 x 28) mm

HFA 21 RF Bypass

Capacitances 10 pF ... 100 nF

Dielectric strength 50 V

Shielding tent (900x500x400 mm)

Attenuated shielding 45 dB - 50 dB / 30 MHz - 1GHz

Sizes (L x W x H) (900 x 500 x 400) mm

Weight 12 kg

Near Field Probes

Frequency range 30 MHz - 3 GHz

CS-ESA software

Operating system Windows XP/Vista/7 (latest service packs)

PA 203 preamplifier

Frequency range 100 kHz - 3 GHz

Amplification 20 dB

Supply voltage 12 V DC

Current input 50 mA

Max. input power +13 dBm

The FLS 106 PCB Langer scanner is a 3-axes positioning system used in conjunction with near-field probes in order to measure magnetic or E-fields up to 20 GHz and to pulse the device under test via H-field sources with pulse fields up to 200 mT.
The near-field probes or field sources can be moved along all three axes above the assembly.
A digital microscope camera allows for optical positioning control above the object being measured.
The included collision protection system stops the vertical movement of the probe if it touches the device under test.

The use of the scanner with near-field probes from the SX, RF, XF or LF family allows measurements in the frequency range from 100 kHz up to 20 GHz.
The FLS 106 PCB scanner is controlled by the ChipScan-Scanner software via a PC. The software simultaneously allows measured values reading from the spectrum analyzer, graphic representation (2D or 3D), the storage and output of measured data (CSV data file). The FLS 106 PCB scanner can be upgraded to a 4-axes positioning system via a rotary unit.

Scope of delivery

• 1xFLS 106 PCB, 3-Axis Positioning System
• 1xCS-Scanner, ChipScan-Scanner Software / USB
• 1xUH DUT set, Universal Holder for Langer scanner
• 1xSH 01, Probe Holder for Langer scanner
• 1xDM-CAM, Digital Microscope Camera
• 1x FLS 106 PCB acc, Accessories
• 1x FLS 106 m, FLS 106 Set User Manual

Recommended products

• SX1 set, Near-Field Probes 1 GHz up to 10 GHz
• XF Product family, Near-Field Probes 30 MHz up to 6 GHz
• RF Product family, Near-Field Probes 30 MHz up to 3 GHz
• LF Product family, Near-Field Probes 100 kHz up to 50 MHz
• PA 203 SMA, Preamplifier 100 kHz up to 3 GHz
• PA 303 SMA, Preamplifier 100 kHz up to 3 GHz
• PA 306 SMA, Preamplifier 100 kHz up to 6 GHz

Technical parameters

Supply voltage 110 V / 230 V

Interface USB Axes x, y, z; α

Max. traverse range (400 x 600 x 120) mm

Min. step size (20 x 20 x 20) µm

Positioning speed (20 x 25 x 10) mm/s

Weight 75 kg

Sizes (L x W x H) (1030 x 775 x 900) mm

The E1 is a set of EMC tools used for EMI suppression in printed circuit boards during the development phase. The developer can use the E1 set to quickly identify the causes of burst and ESD interference. This allows the developer to design suitable measures to solve the causes of the interference. It can also be used to test the effectiveness of the measures taken. The E1 test set-up is small and fits easily on a developer’s desk. The E1 set user manual describes EMC mechanisms and provides detailed descriptions of basic measuring strategies for interference suppression in printed circuit boards. The E1 set includes a generator to generate burst and ESD disturbances.

Scope of delivery

• 1xSGZ 21, Burst Generator
• 1xS21, Optical Sensor (10 Mbps)
• 1xBS 02, Magnetic Field Source
• 1xBS 04DB, Magnetic Field Source
• 1xBS 05D, Magnetic Field Source
• 1xBS 05DU, Magnetic Field Source
• 1xES 00, E-Field Source
• 1xES 01, E-Field Source
• 1xES 02, E-Field Source
• 1xES 05D, E-Field Source
• 1xES 08D, E-Field Source
• 1xMS 02, Magnetic Field Probe
• 1xE1 acc, Accessories
• 1x NT FRI EU, Power Supply Unit
• 1x E1 case, System Case
• 1x E1 m, E1 Set User Manual

Technical parameters

S21 optical sensor

Transmission range DC...10 Mbps

Optical fibre connector 2.2 mm Ø

Supply voltage (3-5) V

Current input 10 mA

SGZ 21 burst Generator

Pulse parameter

Rise time ca. 2 ns

Tail time ca. 10 ns

Peak values ca. 0...1500 V

Optical input

Optical fiber 2.2 mm

Max. frequency 5 MHz

Min. pulse width 100 ns

Supply voltage 12 V / 200 mA

Sizes (L x W x H) (154 x 100 x 62) mm

The mini burst field generators are particularly small. They are used to identify and eliminate weak points in electronic assemblies in the development phase. They generate a burst or an ESD field at their tip. The mini burst generators are guided by hand across the equipment under test (e.g. printed circuit board) with their field-emitting tips close to its surface. The weak points respond to the pulsed field and malfunctions will occur. The burst field generators can be applied to selected individual sections of the circuit board design to identify potential weak points (faults in the ground system, individual traces or IC pins). Separate magnetic (P11 and P12) and electric (P21) coupling allows an optimal adaptation of EMC countermeasures to the respective weak point.

Scope of delivery

• 1xP11, Mini Burst Field Generator (B)
• 1xP12, Mini Burst Field Generator (B)
• 1xP21, Mini Burst Field Generator (E)
• 1x P1 case, Mini Burst Field Generators Case
• 1x P1 m, P1 Set User Manual

Technical parameters

Generated E-field strength ca. 100 kV/m

Generated magnetic flux density ca. 1 mT

Pulse parameter

Frequency single / 5 kHz

Supply voltage 1.5 V / AAA