Services: Seminars, consulting, measurement services

The ESA1 is a system of EMC tools for relative measurements of interference emissions from assemblies and devices. The associated CS-ESA software enables developers to quickly and comprehensively eliminate interference from the device under test. The measurements of interference emissions carried out with the ESA1 during development are proportional to the results of far-field measurements or measurements with network simulations.

The ESA1 tools are used to locate sources of interference and identify the paths of interference emissions. This allows appropriate EMC measures to be derived and dimensioned. The improvements achieved with the ESA1 have a proportional effect on the result of the far-field measurement. The ESA1 is designed for the developer's workplace.

Special features

• Measurement of conducted emissions (100kHz – 30MHz; automotive 80MHz) and an evaluation for radiated emissions up to 1GHz
• Shielded measurement cabin to reduce ambient interference
• Small-scale and therefore reproducible measurement setup
• Measurement of all interference generated by the electronics (measurement of PCB excitation) by sum current measurement (HFW21)
• Simulation of various coupling paths with HFA21
• Fast troubleshooting possible, as it is easy to switch between measurement with HFW21 and near-field probes
• Simple and fast evaluation of EMC measures on the electronics possible
• Wired measurements according to automotive standards possible with NNB21

Details and scope of delivery

click at -> More from us -> Our product

With the new immunity parameters, our near-field probes have now been specified for RF power injection.

The first parameter specifies the maximum power that can be continuously injected into the probe over a
long period of time. The second is the probe factor, as defined in IEC 62132-9 (Immunity Scan of ICs). For
the immunity parameters please visit our booth or contact us directly.

Please note that power injection using near-field probes should not be performed while holding the probes in your hand. Potential health risks cannot be ruled out during improper handheld operation. Ensure that the probe and the device under test are adequately shielded during RF injection with near-field probes.

The IC Test System from Langer EMV-Technik enables the precise determination of the EMC properties of integrated circuits. It offers standard-compliant and pre-compatible tests for immunity and emissions. The compact, EMC-safe test environment allows flexible pin contacting and high repeatability. The advantages lie in the identification of sensitive pins, the control of layout and component selection, and the optimization of existing ICs. This allows EMC risks to be identified at an early stage and increases reliability and product quality.

Special features

• HF-compatible connection of the DUT to the adapter circuit board
• Compact design
• Solid GND plane as reference ground
• The measurement system does not need to be integrated into the layout of the test board
• Flexible contacting options for all pins
• One system for all IC measurements (for standard measurements or during development)
• Reproducible measurements
• Advantages for IC users:
  • Tracking of changes in EMC parameters (e.g., during component replacement)
  • Impact on component selection and layout
• Advantages for IC manufacturers:
  • Verification of EMC parameters of existing ICs
  • Elucidation of causes of interference and optimization

Details and scope of delivery

See -> More from us -> Our product

The E2 set TS 23 Immunity Development System is a comprehensive system of EMC tools designed for pre-compliance immunity testing. It enables efficient troubleshooting and precise weak-point analysis of electronic systems at all integration levels, from component to full system. This allows engineers to identify vulnerabilities early in the development process and implement corrective measures well before formal compliance testing.

The following core benefits deliver maximum performance and user value:

• TS 23 pulse generator for precise pulse‑voltage control and adjustable output rate
• Switchable between continuous voltage levels and voltage ramp for different validation applications
• Additional functions including pulse repetition patterns, and external triggering
• Newly developed differential probes, differential injectors, and MA 33 magnetic adapters for shortest possible rise times
• ESD‑related failure patterns can be reliably reproduced under controlled conditions

The ESA1 is a system of EMC tools for relative measurements of interference emissions from assemblies and devices. The associated CS-ESA software enables developers to quickly and comprehensively eliminate interference from the device under test. The measurements of interference emissions carried out with the ESA1 during development are proportional to the results of far-field measurements or measurements with network simulations.

The ESA1 tools are used to locate sources of interference and identify the paths of interference emissions. This allows appropriate EMC measures to be derived and dimensioned. The improvements achieved with the ESA1 have a proportional effect on the result of the far-field measurement. The ESA1 is designed for the developer's workplace.

Special features

• Measurement of conducted emissions (100kHz – 30MHz; automotive 80MHz) and an evaluation for radiated emissions up to 1GHz
• Shielded measurement cabin to reduce ambient interference
• Small-scale and therefore reproducible measurement setup
• Measurement of all interference generated by the electronics (measurement of PCB excitation) by sum current measurement (HFW21)
• Simulation of various coupling paths with HFA21
• Fast troubleshooting possible, as it is easy to switch between measurement with HFW21 and near-field probes
• Simple and fast evaluation of EMC measures on the electronics possible
• Wired measurements according to automotive standards possible with NNB21

Details and scope of delivery

click at -> More from us -> Our product

With the new immunity parameters, our near-field probes have now been specified for RF power injection.

The first parameter specifies the maximum power that can be continuously injected into the probe over a
long period of time. The second is the probe factor, as defined in IEC 62132-9 (Immunity Scan of ICs). For
the immunity parameters please visit our booth or contact us directly.

Please note that power injection using near-field probes should not be performed while holding the probes in your hand. Potential health risks cannot be ruled out during improper handheld operation. Ensure that the probe and the device under test are adequately shielded during RF injection with near-field probes.

The IC Test System from Langer EMV-Technik enables the precise determination of the EMC properties of integrated circuits. It offers standard-compliant and pre-compatible tests for immunity and emissions. The compact, EMC-safe test environment allows flexible pin contacting and high repeatability. The advantages lie in the identification of sensitive pins, the control of layout and component selection, and the optimization of existing ICs. This allows EMC risks to be identified at an early stage and increases reliability and product quality.

Special features

• HF-compatible connection of the DUT to the adapter circuit board
• Compact design
• Solid GND plane as reference ground
• The measurement system does not need to be integrated into the layout of the test board
• Flexible contacting options for all pins
• One system for all IC measurements (for standard measurements or during development)
• Reproducible measurements
• Advantages for IC users:
  • Tracking of changes in EMC parameters (e.g., during component replacement)
  • Impact on component selection and layout
• Advantages for IC manufacturers:
  • Verification of EMC parameters of existing ICs
  • Elucidation of causes of interference and optimization

Details and scope of delivery

See -> More from us -> Our product