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DAK-R
Description
The DAK-R is a cutting-edge solution for non-destructive dielectric measurement of thin, low-loss substrates (0.05 – 3 mm). Resonator methods are the most accurate techniques for determining the dielectric properties of low-loss materials. DAK-R is based on an advanced implementation of split-cylinder resonator (SCR). Unlike conventional SCRs, which operate only at fundamental frequencies, DAK-R features an innovative cavity design paired with a state-of-the-art solver. This suppresses unwanted resonances, extends the permittivity measurement range, and makes DAK-R the only resonator on the market capable of accurate, broadband measurements at 10, 17, 26, 35, and 45 GHz all in a single instrument.
Compliant with IPC test method TM-650 2.5.5.13, DAK-R consists of a cavity divided into two equal halves. A sample is positioned in the gap between these sections, where a TE01n resonance is excited. By analyzing the resonance frequency and quality factor (Q), the relative permittivity and loss tangent of the sample are determined. The resonance frequency of the resonator is a function of the relative permittivity and thickness of the substrate. Thicker substrates and higher values of relative permittivity shift the resonance to lower frequencies.
The DAK-R and DAK-TL2 combo delivers the ultimate solution and sets a new standard for accurate, broadband dielectric characterization.
