IC Test System

The ESA1 is a system of EMC tools for relative measurements of interference emissions from assemblies and devices. The associated CS-ESA software enables developers to quickly and comprehensively eliminate interference from the device under test. The measurements of interference emissions carried out with the ESA1 during development are proportional to the results of far-field measurements or measurements with network simulations.

The ESA1 tools are used to locate sources of interference and identify the paths of interference emissions. This allows appropriate EMC measures to be derived and dimensioned. The improvements achieved with the ESA1 have a proportional effect on the result of the far-field measurement. The ESA1 is designed for the developer's workplace.

Special features

• Measurement of conducted emissions (100kHz – 30MHz; automotive 80MHz) and an evaluation for radiated emissions up to 1GHz
• Shielded measurement cabin to reduce ambient interference
• Small-scale and therefore reproducible measurement setup
• Measurement of all interference generated by the electronics (measurement of PCB excitation) by sum current measurement (HFW21)
• Simulation of various coupling paths with HFA21
• Fast troubleshooting possible, as it is easy to switch between measurement with HFW21 and near-field probes
• Simple and fast evaluation of EMC measures on the electronics possible
• Wired measurements according to automotive standards possible with NNB21

Details and scope of delivery

click at -> More from us -> Our product

EMC problems slow down development projects, tie up resources, and often lead to costly rework shortly before market launch. Langer EMC Technology helps developers identify these stumbling blocks early on and eliminate them in a targeted manner so that projects remain plannable and products can be launched safely on the market.

Consulting and troubleshooting

Our EMC consulting starts where problems arise: directly on your assembly or device. Our engineers work with you to analyze faults, identify weak points, and develop concrete measures for improvement. We don't just look at individual measurements, but at the interaction between the assembly, the environment, and coupling mechanisms.

With over 35 years of experience in EMC troubleshooting and the targeted use of our own measurement and analysis tools, we make sources of interference visible and reproducible. Fully equipped measurement areas allow us to evaluate them realistically.

Seminars and workshops

Developers understand EMC best directly on their assemblies. In our experimental seminars on interference immunity and interference emission, you will practice practical and experimental measurements, optimization methods, and interference suppression measures during development.

• Hands-on at your own experimental stations
• Practical examples from industry
• Option of in-house seminars at your location

Our seminar leaders are experienced EMC engineers who regularly work on consulting and measurement projects. Accordingly, the content is practical, with many tools and tips that can be directly implemented in everyday development work.

Measurement services

We measure not only assemblies, but also ICs, connectors, and cables for their EMC properties. This allows you to know exactly how your electronics behave in combination—and to specifically address any weak points.

Why Langer EMC-Technik

• Over 35 years of experience in EMC consulting and optimization
• Practical knowledge gained from international development projects
• Support at PCB and IC level
• Proprietary EMC tools for faster, easier troubleshooting
• Measurement technology directly at the developer's workplace to support the development process

With consulting, seminars, and measurement services, we support you in considering EMC at an early stage and reducing development costs.

With the new immunity parameters, our near-field probes have now been specified for RF power injection.

The first parameter specifies the maximum power that can be continuously injected into the probe over a
long period of time. The second is the probe factor, as defined in IEC 62132-9 (Immunity Scan of ICs). For
the immunity parameters please visit our booth or contact us directly.

Please note that power injection using near-field probes should not be performed while holding the probes in your hand. Potential health risks cannot be ruled out during improper handheld operation. Ensure that the probe and the device under test are adequately shielded during RF injection with near-field probes.

The E2 set TS 23 Immunity Development System is a comprehensive system of EMC tools designed for pre-compliance immunity testing. It enables efficient troubleshooting and precise weak-point analysis of electronic systems at all integration levels, from component to full system. This allows engineers to identify vulnerabilities early in the development process and implement corrective measures well before formal compliance testing.

The following core benefits deliver maximum performance and user value:

• TS 23 pulse generator for precise pulse‑voltage control and adjustable output rate
• Switchable between continuous voltage levels and voltage ramp for different validation applications
• Additional functions including pulse repetition patterns, and external triggering
• Newly developed differential probes, differential injectors, and MA 33 magnetic adapters for shortest possible rise times
• ESD‑related failure patterns can be reliably reproduced under controlled conditions

The ESA1 is a system of EMC tools for relative measurements of interference emissions from assemblies and devices. The associated CS-ESA software enables developers to quickly and comprehensively eliminate interference from the device under test. The measurements of interference emissions carried out with the ESA1 during development are proportional to the results of far-field measurements or measurements with network simulations.

The ESA1 tools are used to locate sources of interference and identify the paths of interference emissions. This allows appropriate EMC measures to be derived and dimensioned. The improvements achieved with the ESA1 have a proportional effect on the result of the far-field measurement. The ESA1 is designed for the developer's workplace.

Special features

• Measurement of conducted emissions (100kHz – 30MHz; automotive 80MHz) and an evaluation for radiated emissions up to 1GHz
• Shielded measurement cabin to reduce ambient interference
• Small-scale and therefore reproducible measurement setup
• Measurement of all interference generated by the electronics (measurement of PCB excitation) by sum current measurement (HFW21)
• Simulation of various coupling paths with HFA21
• Fast troubleshooting possible, as it is easy to switch between measurement with HFW21 and near-field probes
• Simple and fast evaluation of EMC measures on the electronics possible
• Wired measurements according to automotive standards possible with NNB21

Details and scope of delivery

click at -> More from us -> Our product

EMC problems slow down development projects, tie up resources, and often lead to costly rework shortly before market launch. Langer EMC Technology helps developers identify these stumbling blocks early on and eliminate them in a targeted manner so that projects remain plannable and products can be launched safely on the market.

Consulting and troubleshooting

Our EMC consulting starts where problems arise: directly on your assembly or device. Our engineers work with you to analyze faults, identify weak points, and develop concrete measures for improvement. We don't just look at individual measurements, but at the interaction between the assembly, the environment, and coupling mechanisms.

With over 35 years of experience in EMC troubleshooting and the targeted use of our own measurement and analysis tools, we make sources of interference visible and reproducible. Fully equipped measurement areas allow us to evaluate them realistically.

Seminars and workshops

Developers understand EMC best directly on their assemblies. In our experimental seminars on interference immunity and interference emission, you will practice practical and experimental measurements, optimization methods, and interference suppression measures during development.

• Hands-on at your own experimental stations
• Practical examples from industry
• Option of in-house seminars at your location

Our seminar leaders are experienced EMC engineers who regularly work on consulting and measurement projects. Accordingly, the content is practical, with many tools and tips that can be directly implemented in everyday development work.

Measurement services

We measure not only assemblies, but also ICs, connectors, and cables for their EMC properties. This allows you to know exactly how your electronics behave in combination—and to specifically address any weak points.

Why Langer EMC-Technik

• Over 35 years of experience in EMC consulting and optimization
• Practical knowledge gained from international development projects
• Support at PCB and IC level
• Proprietary EMC tools for faster, easier troubleshooting
• Measurement technology directly at the developer's workplace to support the development process

With consulting, seminars, and measurement services, we support you in considering EMC at an early stage and reducing development costs.

With the new immunity parameters, our near-field probes have now been specified for RF power injection.

The first parameter specifies the maximum power that can be continuously injected into the probe over a
long period of time. The second is the probe factor, as defined in IEC 62132-9 (Immunity Scan of ICs). For
the immunity parameters please visit our booth or contact us directly.

Please note that power injection using near-field probes should not be performed while holding the probes in your hand. Potential health risks cannot be ruled out during improper handheld operation. Ensure that the probe and the device under test are adequately shielded during RF injection with near-field probes.