Optimization of EMI System Test Speed

Using practical examples, the paper demonstrates how test workflows can be optimized, emission sources can be identified more accurately, and measurement data can deliver deeper insights. It also introduces the technical principles and application areas of modern EMI measurement systems.

The whitepaper provides practical approaches for reducing measurement time, increasing test throughput, and enhancing analysis and evaluation capabilities within EMC test environments.

Chapter overview

• Challenges of modern EMI system testing
• Impact of FFT technology and wide measurement bandwidths on test speed
• Continuous turntable rotation for accelerated measurement workflows
• Optimization of angular resolution and receiver scan times
• Multi-receiver and multi-antenna measurement concepts
• Improved reliability when testing devices with changing operating modes
• Enhanced emission analysis and source identification techniques
• Summary of productivity and quality improvements in modern EMI measurement systems

Author

Tobias Groß,
Rohde & Schwarz, Germany

Tobias Groß has been responsible for EMI receivers in product management at Rohde & Schwarz since 2018. In this role, he maintains close contact with customers through seminars and training sessions and continuously works on further developing both the instruments and their practical applications. Prior to this, he studied Electrical Engineering at the Technical University of Berlin and the University of Waterloo in Canada, specializing in high-frequency engineering and signal analysis. In his spare time, he enjoys 3D printing and training for triathlons.